Overview:
Kingston’s Industrial SD card delivers superior endurance and reliability across industrial applications including automation, telecommunication, data systems, building management and POS systems. It is designed and tested to withstand the most demanding environmental factors. With an operating temperature of -40°C to 85°C, Kingston’s Industrial SD card can operate normally in extended temperature ranges. The card utilises the industry-leading pSLC mode to provide reliable read read/write speeds up to 100/80MB/s. It is rated up to 1920 TBW with 30K P/E cycles and has a built-in feature set specific to endurance, performance and industrial needs.
Features:
Durable in extreme temperatures
Designed and tested to withstand an extended temperature range of -40°C to 85°C for use in harsh conditions.
High endurance and reliability
Up to 1920 TBW and rated to endure 30K P/E cycles to meet requirements for a wide range of industrial applications.
UHS-I compliant
read/write speeds up to 100/80MB/s with U3, V30 and A1 support for Android-based applications
Industrial-grade built-in features
Wear levelling, bad block management and an optional health monitoring tool to manage the lifespan of your card.
Specifications:
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Specifications | |
| Product Code | SDIT/32GB |
| Capacity | 32GB |
| Speed | Up to 100MB/s read, 80MB/s write |
| Performance | Class 10, UHS-I, U3, V30, A1 |
| Endurance | Up to 1920 TBW |
| 30K P/E cycles | |
| NAND | TLC in pSLC mode |
| Dimensions | 24mm x 32mm x 2.1mm |
| Format | FAT32 for SDHC and exFAT for SDXC |
| Operating & storage temperature | -40°C to 85°C |
| Voltage | 3.3V |
| Industrial features | Bad block management |
| Power failure protection | |
| Wear levelling | |
| Auto-refresh read distribution protection | |
| Dynamic data refresh | |
| SiP - system in package | |
| Garbage collection | |
| Health monitoring | |
| Durability | Waterproof |
| Temperature proof | |
| Protected from airport x-rays | |
| Thermal cycle testing | Interval testing completed at various extreme temperatures |
| Vigorous temperature humidity bias | Several hundred hours of testing to ensure durability at varying levels of humidity |
| Wide temp chamber testing | Completed on all SDIT cards prior to production |
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